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Many of today’s
chip companies are short on DFT resources.
Given that critical skills are scare, you need
someone you can trust, someone to bridge
the gap between design and testing. ChipBridge
provides the architects and engineers with
the expertise and resources you need to solve
your DFT challenges.
Our consistent DFT approach can save you time
and money at the tester and result in higher-quality
parts. What’s
more, we provide our services on-site or off-site
when you need us, for as long as you need
us.
Consulting
Are your DFT strategies the
best they can possibly be? We can work
with you to identify what’s working and what’s not. Once
we discover the opportunities for improvement
in your strategy, we help you incorporate
the changes to make your DFT state of the
art.
Are you looking for an entirely new and comprehensive
approach to your DFT? We can design a customized DFT flow and methodology
from the ground up for your business. No more missed schedules, no
more costly lessons, just the sound DFT strategies your business needs.
Contracting
Need DFT manpower today? We provide experienced
engineers to handle anything and everything DFT related to get your
project to market, including: pattern generation, scan insertion, on-chip
test control architecture and design, debug feature architecture and
design, test clock control design, MBIST design, LBIST design, JTAG
design, and BSDL creation.
Plus, we have the expertise to interface
with your manufacturer for delivery, debug and bringup of test vectors.
We will support your engineers in the system bringup lab to utilize
built-in test and debug features. We bring in JTAG-based debug tools
to turn your scan strings into virtual windows into your chip.
Training
Let us help you build your own in-house team
of DFT engineers, or take your current practices to the next level.
Our training services are centered on today’s state-of-the-art
tools, strategies and trends. We come to you with a mixture of topical
presentations and hands-on exercises covering MBIST, LBIST, ATPG, test
clocking control, on-chip test controllers, all things JTAG, and more.
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